Please use this identifier to cite or link to this item: http://cmuir.cmu.ac.th/jspui/handle/6653943832/53650
Title: Diffuse dielectric behavior of (Bi<inf>0.5</inf>Na<inf>0.5</inf>)Zr<inf>1-x</inf>Ti<inf>x</inf>O<inf>3</inf>lead-free ceramics
Authors: Panupong Jaiban
Sukanda Jiansirisomboon
Anucha Watcharapasorn
Rattikorn Yimnirun
Ruyan Guo
Amar S. Bhalla
Keywords: Materials Science
Physics and Astronomy
Issue Date: 2-Jan-2014
Abstract: (Bi0.5Na0.5)Zr1-xTixO3with x = 0, 0.1, 0.2, 0.3, 0.4, 0.5 and 0.6 ceramics were fabricated by a conventional sintering technique at 850-950°C for 2 h. From X-ray diffraction study, three regions of different phases were observed in the ceramic system i.e., orthorhombic phase region (0 ≤ x ≤ 0.2), mixed-phase region (0.3 ≤ x ≤ 0.4), and rhombohedral phase region (0.5 ≤ x ≤ 0.6). The observed diffuse dielectric phase transition could be correlated to the compositional inhomogeneity of the samples. The dielectric properties as a function of the temperature at different frequency indicated normal ferroelectric behavior in BNZ and BNZT ceramics. The phase transformation from orthorhombic phase to rhombohderal phase affected significantly the dielectric enhancement and decrease of the maximum temperature in this ceramic system. © 2014 Copyright Taylor and Francis Group, LLC.
URI: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84892877615&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/53650
ISSN: 15635112
00150193
Appears in Collections:CMUL: Journal Articles

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