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dc.contributor.authorPanupong Jaibanen_US
dc.contributor.authorSukanda Jiansirisomboonen_US
dc.contributor.authorAnucha Watcharapasornen_US
dc.contributor.authorRattikorn Yimnirunen_US
dc.contributor.authorRuyan Guoen_US
dc.contributor.authorAmar S. Bhallaen_US
dc.description.abstract(Bi0.5Na0.5)Zr1-xTixO3with x = 0, 0.1, 0.2, 0.3, 0.4, 0.5 and 0.6 ceramics were fabricated by a conventional sintering technique at 850-950°C for 2 h. From X-ray diffraction study, three regions of different phases were observed in the ceramic system i.e., orthorhombic phase region (0 ≤ x ≤ 0.2), mixed-phase region (0.3 ≤ x ≤ 0.4), and rhombohedral phase region (0.5 ≤ x ≤ 0.6). The observed diffuse dielectric phase transition could be correlated to the compositional inhomogeneity of the samples. The dielectric properties as a function of the temperature at different frequency indicated normal ferroelectric behavior in BNZ and BNZT ceramics. The phase transformation from orthorhombic phase to rhombohderal phase affected significantly the dielectric enhancement and decrease of the maximum temperature in this ceramic system. © 2014 Copyright Taylor and Francis Group, LLC.en_US
dc.subjectMaterials Scienceen_US
dc.subjectPhysics and Astronomyen_US
dc.titleDiffuse dielectric behavior of (Bi<inf>0.5</inf>Na<inf>0.5</inf>)Zr<inf>1-x</inf>Ti<inf>x</inf>O<inf>3</inf>lead-free ceramicsen_US
article.volume458en_US Mai Universityen_US University of Technologyen_US Center of Excellence on Advanced Functional Nanomaterialsen_US of Texas at San Antonioen_US
Appears in Collections:CMUL: Journal Articles

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