Please use this identifier to cite or link to this item: http://cmuir.cmu.ac.th/jspui/handle/6653943832/60971
Title: Atomic force microscopy imaging of ZnO nanodots deposited on quartz by sparking off different tip shapes
Authors: T. Kumpika
W. Thongsuwan
P. Singjai
Authors: T. Kumpika
W. Thongsuwan
P. Singjai
Keywords: Chemistry;Materials Science;Physics and Astronomy
Issue Date: 1-Jan-2007
Abstract: We have demonstrated a simple method for depositing ZnO nanodots on quartz substrates by sparking off different tip shapes at voltages of 2, 4 and 6 kV in air at atmospheric pressure. A comparison was made among the three tip shapes: the sharp tip, the conical tip and the dull tip. The surface morphology was then observed by atomic force microscopy. The mean height of the randomly distributed dots of approximately 8 nm was successfully deposited from the sharp tip at 6 kV. Characterizations by UV-vis spectroscopy and Raman spectroscopy have confirmed the presence of ZnO and the quality improvement by annealing treatments. Moreover, a nucleation mechanism of the nanodot formation is discussed. Copyright © 2006 John Wiley & Sons, Ltd.
URI: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33846549951&origin=inward
http://cmuir.cmu.ac.th/jspui/handle/6653943832/60971
ISSN: 10969918
01422421
Appears in Collections:CMUL: Journal Articles

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