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|Title:||Optical interferometric technique for induced strain ferroelectric loop study at low frequency|
|Abstract:||Michelson interferometric technique was modified in the setup and used to measure very small changes in optical path length for electric field induced-strain phenomena. Induced-strain is established in the sample when the beam of light propagating through the sample surface undergoes a shift in phase, which in turn leads to a change in the intensity of the interference pattern formed where the reference and probing beams recombine. In this work the electric field induced-strain was measured as a function of electric field (s-E loop) and polarization (s-P loop) of PbMg1/3Nb2/3O3(PMN) and 0.7PbMg1/3Nb2/3O3-0.3PbZr0.52Ti0.48O3(0.7PMN-0.3PZT) ceramics, which showed electrostrictive (quadratic shape curve) and piezoelectric (butterfly shape curve) behavior at various frequency (0.01-1Hz). © (2014) Trans Tech Publications, Switzerland.|
|Appears in Collections:||CMUL: Journal Articles|
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