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dc.contributor.authorTharathip Sreesattabuden_US
dc.contributor.authorBrady J. Gibbonsen_US
dc.contributor.authorAnucha Watcharapasornen_US
dc.contributor.authorSukanda Jiansirisomboonen_US
dc.date.accessioned2018-09-04T09:29:53Z-
dc.date.available2018-09-04T09:29:53Z-
dc.date.issued2013-07-01en_US
dc.identifier.issn20936788en_US
dc.identifier.issn17388090en_US
dc.identifier.other2-s2.0-84880439079en_US
dc.identifier.other10.1007/s13391-013-0009-1en_US
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84880439079&origin=inwarden_US
dc.identifier.urihttp://cmuir.cmu.ac.th/jspui/handle/6653943832/52678-
dc.description.abstractPb(Zr0.52Ti0.48)O3 or PZT thin films embedded with CuO nano-particles were successfully prepared by a hybrid sol-gel process. In this process, CuO (0, 0.1, 0.2, 0.3, 0.4, 0.5 and 1 wt. %) nanopowder was suspended in an organometallic solution of PZT, and then coated on platinised silicon substrate using a spin-coating technique. The influence of CuO nano-particles' dispersion on the phase of PZT thin films was investigated. XRD results showed a perovskite phase in all films. At the CuO concentration of 0.4-1 wt. %, a second phase was observed. The addition of CuO nano-particles affected the orientation of PZT thin films. The addition was also found to reduce the ferroelectric properties of PZT thin films. However, at 0.2 wt. % CuO concentration, the film exhibited good ferroelectric properties similar to those of PZT films. In addition, the fatigue retention properties of the PZT/CuO system was observed, and it showed 14% fatigue at 108 switching bipolar pulse cycles while the fatigue in PZT thin films was found to be 17% at the same switching bipolar pulse cycles. © 2013 The Korean Institute of Metals and Materials and Springer Science+Business Media Dordrecht.en_US
dc.subjectMaterials Scienceen_US
dc.titlePhase and electrical properties of PZT thin films embedded with CuO nano-particles by a hybrid sol-gel routeen_US
dc.typeJournalen_US
article.title.sourcetitleElectronic Materials Lettersen_US
article.volume9en_US
article.stream.affiliationsChiang Mai Universityen_US
article.stream.affiliationsOregon State Universityen_US
Appears in Collections:CMUL: Journal Articles

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